An Incremental Unified Framework for Small Defect InspectionSep 29, 2024·Jiaqi Tang,Hao Lu,Xiaogang Xu,Ruizheng Wu,Sixing Hu,Tong Zhang,Tsz Wa Cheng,Ming GeYing-Cong Chen,Fugee Tsung· 0 min read Cite CodeType1PublicationProceedings of the European conference on computer vision (ECCV)Last updated on Jul 13, 2024 AuthorsYing-Cong ChenAssistant Professor ← Uni-Renderer: Unifying Rendering and Inverse Rendering Via Dual Stream Diffusion Jan 1, 2025Bi-TTA: Bidirectional Test-Time Adapter for Remote Physiological Measurement Sep 29, 2024 →
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